A Similarity Metric for the Inputs of OO Programs and Its Application in Adaptive Random Testing
Chen, Jinfu, Kuo, Fei-Ching, Chen, Tsong Yueh, Towey, Dave, Su, Chenfei, Huang, RubingYear:
2016
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2016.2628759
File:
PDF, 3.81 MB
english, 2016