Impacts of BeiDou stochastic model on reliability: overall test,w-test and minimal detectable bias
Li, Bofeng, Zhang, Lei, Verhagen, SandraVolume:
21
Language:
english
Journal:
GPS Solutions
DOI:
10.1007/s10291-016-0596-z
Date:
July, 2017
File:
PDF, 3.67 MB
english, 2017