[AIP SPACE TECHNOLOGY AND APPLICATIONS INTERNATIONAL FORUM- STAIF 2002 - Albuquerque, New Mexico (USA) (3-6 Feb 2002)] AIP Conference Proceedings - Analysis of the SAFE-30 resistance-heated test data
Van Duyn, Lee B., Poston, David I., Reid, Robert S.Volume:
608
Year:
2002
Language:
english
DOI:
10.1063/1.1449791
File:
PDF, 15.63 MB
english, 2002