The thickness design of unintentionally doped GaN interlayer matched with background doping level for InGaN-based laser diodes
Chen, P., Zhao, D. G., Jiang, D. S., Zhu, J. J., Liu, Z. S., Yang, J., Li, X., Le, L. C., He, X. G., Liu, W., Li, X. J., Liang, F., Zhang, B. S., Yang, H., Zhang, Y. T., Du, G. T.Volume:
6
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4945015
Date:
March, 2016
File:
PDF, 2.82 MB
english, 2016