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Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy
Balke, Nina, Jesse, Stephen, Yu, Pu, Ben Carmichael,, Kalinin, Sergei V, Tselev, AlexanderVolume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/42/425707
Date:
October, 2016
File:
PDF, 1.11 MB
english, 2016