Quantification of surface displacements and...

Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

Balke, Nina, Jesse, Stephen, Yu, Pu, Ben Carmichael,, Kalinin, Sergei V, Tselev, Alexander
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Volume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/42/425707
Date:
October, 2016
File:
PDF, 1.11 MB
english, 2016
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