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[IEEE 2016 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC) - Copenhagen, Denmark (2016.11.1-2016.11.2)] 2016 IEEE Nordic Circuits and Systems Conference (NORCAS) - Oscillation ring testing methodology of TSVs in 3D stacked ICs
Harb, Shadi M S, Eisenstadt, WilliamYear:
2016
Language:
english
DOI:
10.1109/NORCHIP.2016.7792911
File:
PDF, 2.49 MB
english, 2016