![](/img/cover-not-exists.png)
[IEEE 2016 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC) - Copenhagen, Denmark (2016.11.1-2016.11.2)] 2016 IEEE Nordic Circuits and Systems Conference (NORCAS) - A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie, Ubar, Raimund, Kostin, Sergei, Raik, JaanYear:
2016
Language:
english
DOI:
10.1109/NORCHIP.2016.7792915
File:
PDF, 362 KB
english, 2016