[IEEE 2016 IEEE 8th International Conference on Biometrics Theory, Applications and Systems (BTAS) - Niagara Falls, NY, USA (2016.9.6-2016.9.9)] 2016 IEEE 8th International Conference on Biometrics Theory, Applications and Systems (BTAS) - Automated classification of mislabeled near-infrared left and right iris images using convolutional neural networks

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