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[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - Demonstration of electric double layer p-i-n junction in WSe2
Fathipour, Sara, Paletti, Paolo, Fullerton-Shirey, Susan, Seabaugh, AlanYear:
2016
Language:
english
DOI:
10.1109/drc.2016.7548485
File:
PDF, 1.71 MB
english, 2016