Influence of the gate edge on the reverse leakage current...

AIP Advances 2015 / 09 Vol. 5; Iss. 9

Influence of the gate edge on the reverse leakage current of AlGaN/GaN HEMTs

Chen, YongHe, Ma, XiaoHua, Chen, WeiWei, Hou, Bin, Zhang, JinCheng, Hao, Yue
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4931454
Date:
September, 2015
File:
PDF, 1.44 MB
english, 2015
Conversion to is in progress
Conversion to is failed