[IEEE 2016 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Las Vegas, NV, USA (2016.6.26-2016.7.1)] 2016 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - A Combined EM and Visual Tracking Probabilistic Model for Robust Mosaicking: Application to Fetoscopy
Tella, Marcel, Daga, Pankaj, Chadebecq, Francois, Thompson, Stephen, Shakir, Dzhoshkun I., Dwyer, George, Wimalasundera, Ruwan, Deprest, Jan, Stoyanov, Danail, Vercauteren, Tom, Ourselin, SebastienYear:
2016
Language:
english
DOI:
10.1109/CVPRW.2016.72
File:
PDF, 1.22 MB
english, 2016