[IEEE 2016 IEEE International Symposium on Electromagnetic Compatibility - EMC 2016 - Ottawa, ON, Canada (2016.7.25-2016.7.29)] 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Efficient simulation for large scale transistor level electrostatic discharge analysis and simulation
He, Qing, Au, William, Korobkov, Alexander, Venkateswaran, SubramanianYear:
2016
DOI:
10.1109/isemc.2016.7571642
File:
PDF, 352 KB
2016