[IEEE 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Sendai, Japan (2016.8.22-2016.8.25)] 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Process technological analysis for dynamic characteristic improvement of 16-nm HKMG bulk FinFET CMOS circuits
Su, Ping-Hsun, Li, YimingYear:
2016
Language:
english
DOI:
10.1109/nano.2016.7751468
File:
PDF, 1.32 MB
english, 2016