Josephson effects in MgB/sub 2/ metal masked ion damage junctions
Dae-Joon Kang,, Peng, N.H., Jeynes, C., Webb, R., Lee, H.N., Oh, B., Moon, S.H., Burnell, G., Stelmashenko, N.A., Tarte, E.J., Moore, D.F., Blamire, M.G.Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.814157
Date:
June, 2003
File:
PDF, 652 KB
english, 2003