Critical Thickness of Antiferromagnetic Layer in Exchange Biasing Bilayer System
Mitsumata, Chiharu, Sakuma, Akimasa, Fukamichi, Kazuaki, Tsunoda, Masakiyo, Takahashi, MigakuVolume:
77
Language:
english
Journal:
Journal of the Physical Society of Japan
DOI:
10.1143/JPSJ.77.044602
Date:
April, 2008
File:
PDF, 589 KB
english, 2008