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Effect of Wavelength and Intensity of Light on a-InGaZnO TFTs under Negative Bias Illumination Stress
Kim, Woo-Sic, Lee, Yeol-Hyeong, Cho, Yong-Jung, Kim, Byeong-Koo, Park, Kyung Tae, Kim, OhyunVolume:
6
Year:
2017
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0021701jss
File:
PDF, 861 KB
english, 2017