Noncontact conductivity and dielectric measurement for high...

Noncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing

Orloff, Nathan D., Long, Christian J., Obrzut, Jan, Maillaud, Laurent, Mirri, Francesca, Kole, Thomas P., McMichael, Robert D., Pasquali, Matteo, Stranick, Stephan J., Alexander Liddle, J.
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Volume:
5
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/srep17019
Date:
December, 2015
File:
PDF, 1.04 MB
english, 2015
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