Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material
Jaramillo, R., Sher, Meng-Ju, Ofori-Okai, Benjamin K., Steinmann, V., Yang, Chuanxi, Hartman, Katy, Nelson, Keith A., Lindenberg, Aaron M., Gordon, Roy G., Buonassisi, T.Volume:
119
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4940157
Date:
January, 2016
File:
PDF, 1.28 MB
english, 2016