Variability study of Si nanowire FETs with different junction gradients
Yoon, Jun-Sik, Kim, Kihyun, Rim, Taiuk, Baek, Chang-KiVolume:
6
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4941351
Date:
January, 2016
File:
PDF, 3.17 MB
english, 2016