![](/img/cover-not-exists.png)
[IEEE 2016 IEEE 25th Asian Test Symposium (ATS) - Hiroshima, Japan (2016.11.21-2016.11.24)] 2016 IEEE 25th Asian Test Symposium (ATS) - A Test Method for Finding Boundary Currents of 1T1R Memristor Memories
Lin, Tzu-Ying, Chen, Yong-Xiao, Li, Jin-Fu, Lo, Chih-Yen, Kwai, Ding-Ming, Chou, Yung-FaYear:
2016
Language:
english
DOI:
10.1109/ATS.2016.44
File:
PDF, 354 KB
english, 2016