Analysis of electron energy loss spectroscopy data using geometric extraction methods
Spiegelberg, Jakob, Rusz, Ján, Thersleff, Thomas, Pelckmans, KristiaanVolume:
174
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.12.014
Date:
March, 2017
File:
PDF, 2.58 MB
english, 2017