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[IEEE 2016 IEEE International Conference on High Voltage Engineering and Application (ICHVE) - Chengdu, China (2016.9.19-2016.9.22)] 2016 IEEE International Conference on High Voltage Engineering and Application (ICHVE) - Study on T type transmission line fault location based on voltage traveling wave
Li, Yongfu, Fu, Jin, Wang, Qian, Peng, Huadong, Ji, Yongliang, Zhao, Hongbin, Liu, Jinjun, Zeng, XianglongYear:
2016
Language:
english
DOI:
10.1109/ICHVE.2016.7800718
File:
PDF, 334 KB
english, 2016