Hidden defect recognition based on the improved ensemble...

Hidden defect recognition based on the improved ensemble empirical decomposition method and pulsed eddy current testing

Liu, Baoling, Huang, Pingjie, Zeng, Xuan, Li, Zhinong
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Volume:
86
Language:
english
Journal:
NDT & E International
DOI:
10.1016/j.ndteint.2016.12.009
Date:
March, 2017
File:
PDF, 1.94 MB
english, 2017
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