To the Special section constructed from the selected papers of Thermal investigations of integrated circuits and systems, THERMINIC’15
Rencz, MartaVolume:
67
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.11.010
Date:
December, 2016
File:
PDF, 120 KB
english, 2016