Defects involving interstitial boron in low-temperature irradiated silicon
Khirunenko, L. I., Sosnin, M. G., Duvanskii, A. V., Abrosimov, N. V., Riemann, H.Volume:
94
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.94.235210
Date:
December, 2016
File:
PDF, 376 KB
english, 2016