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[IEEE 2016 IEEE 25th Asian Test Symposium (ATS) - Hiroshima, Japan (2016.11.21-2016.11.24)] 2016 IEEE 25th Asian Test Symposium (ATS) - On Test Points Enhancing Hardware Security
Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Zawada, JustynaYear:
2016
Language:
english
DOI:
10.1109/ATS.2016.24
File:
PDF, 302 KB
english, 2016