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[IEEE 2016 IEEE CPMT Symposium Japan (ICSJ) - Kyoto, Japan (2016.11.7-2016.11.9)] 2016 IEEE CPMT Symposium Japan (ICSJ) - A built-in defective level monitor of resistive open defects in 3D ICs with logic gates
Hashizume, Masaki, Odoriba, Akihiro, Yotsuyanagi, Hiroyuki, Lu, Shyue-KungYear:
2016
DOI:
10.1109/ICSJ.2016.7801299
File:
PDF, 603 KB
2016