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[IEEE 2016 IEEE CPMT Symposium Japan (ICSJ) - Kyoto, Japan (2016.11.7-2016.11.9)] 2016 IEEE CPMT Symposium Japan (ICSJ) - Testability for resistive open defects by electrical interconnect test of 3D ICs without boundary scan flip flops
Ali, Fara Ashikin Binti, Hashizume, Masaki, Ikiri, Yuki, Yotsuyanagi, Hiroyuki, Lu, Shyue-KungYear:
2016
Language:
english
DOI:
10.1109/ICSJ.2016.7801302
File:
PDF, 529 KB
english, 2016