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[IEEE 2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) - Bali, Indonesia (2016.12.4-2016.12.7)] 2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) - Research on reliability assessment of space electronic products based on integration of highly accelerated life test and accelerated degradation test

Liu, Kai, Lv, Congmin, Dang, Wei, Li, Lingjiang, Zou, Tianji, Li, Peng
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Year:
2016
Language:
english
DOI:
10.1109/IEEM.2016.7798157
File:
PDF, 1.60 MB
english, 2016
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