[IEEE 2016 IEEE International Conference on Electro Information Technology (EIT) - Grand Forks, ND, USA (2016.5.19-2016.5.21)] 2016 IEEE International Conference on Electro Information Technology (EIT) - Dielectric property measurement of PLA
Huber, E., Mirzaee, M., Bjorgaard, J., Hoyack, M., Noghanian, S., Chang, I.Year:
2016
Language:
english
DOI:
10.1109/eit.2016.7535340
File:
PDF, 1.90 MB
english, 2016