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Room temperature spectroscopy of deep levels in junction structures using barrier capacitance charging current transients
Gaubas, E, Ceponis, T, Uleckas, A, Grigonis, RVolume:
7
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/7/01/P01003
Date:
January, 2012
File:
PDF, 3.37 MB
english, 2012