Relationship between nano-architectured Ti1−xCuxthin film...

Relationship between nano-architectured Ti1−xCuxthin film and electrical resistivity for resistance temperature detectors

Ferreira, A., Borges, J., Lopes, C., Rodrigues, M. S., Lanceros-Mendez, S., Vaz, F.
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Volume:
52
Language:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-016-0722-x
Date:
May, 2017
File:
PDF, 1.20 MB
english, 2017
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