Relationship between nano-architectured Ti1−xCuxthin film and electrical resistivity for resistance temperature detectors
Ferreira, A., Borges, J., Lopes, C., Rodrigues, M. S., Lanceros-Mendez, S., Vaz, F.Volume:
52
Language:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-016-0722-x
Date:
May, 2017
File:
PDF, 1.20 MB
english, 2017