Investigation of tip-depletion-induced fail in scanning...

Investigation of tip-depletion-induced fail in scanning capacitance microscopy for the determination of carrier type

Wang, Lin, Gautier, Brice, Sabac, Andrei, Bremond, Georges
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Volume:
174
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.12.016
Date:
March, 2017
File:
PDF, 555 KB
english, 2017
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