Investigation of tip-depletion-induced fail in scanning capacitance microscopy for the determination of carrier type
Wang, Lin, Gautier, Brice, Sabac, Andrei, Bremond, GeorgesVolume:
174
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.12.016
Date:
March, 2017
File:
PDF, 555 KB
english, 2017