Conference on In Situ and Correlative Electron Microscopy...

Microscopy and Microanalysis 2016 / 11 Vol. 22; Iss. S5

Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016)

de Jonge, Niels, Mølhave, Kristian, Alloyeau, Damien
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616012034
Date:
November, 2016
File:
PDF, 207 KB
english, 2016
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