Band alignment of TiO 2 /FTO interface determined by X-ray photoelectron spectroscopy: Effect of annealing
Fan, Haibo, Yang, Zhou, Ren, Xianpei, Yin, Mingli, Gao, Fei, Liu, Shengzhong (Frank)Volume:
6
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4941040
Date:
January, 2016
File:
PDF, 1.77 MB
english, 2016