Spectroscopic ellipsometry, optical, structural and...

Spectroscopic ellipsometry, optical, structural and electrical investigation of sprayed pure and Sn-doped ZnO thin films

Mokhtari, H., Benhaliliba, M., Aida, M.S., Attaf, N., Ocak, Y., Ait Kaci, H., Bouziane Hammou, A.
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Volume:
44
Year:
2013
Language:
english
Journal:
EPJ Web of Conferences
DOI:
10.1051/epjconf/20134403006
File:
PDF, 1.09 MB
english, 2013
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