A Fast On-Line Diagnostic Method for Open-Circuit Switch...

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IEEE Transactions on Industry Applications 2017

A Fast On-Line Diagnostic Method for Open-Circuit Switch Faults in SiC-MOSFET Based T-Type Multilevel Inverters

He, Jiangbiao, Demerdash, Nabeel A. O., Weise, Nathan, Katebi, Ramin
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/TIA.2016.2647720
File:
PDF, 2.43 MB
english, 2017
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