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[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Abrasive wear mechanism of Nickel plating in contact to Polyethylene Terephthalate Plastic(PET)
Meng, Chong Kam, Dubey, Subodh, Srivastava, Yogesh KumarYear:
2016
Language:
english
DOI:
10.1109/ipfa.2016.7564301
File:
PDF, 2.24 MB
english, 2016