[IEEE 2016 IEEE 16th International Conference on...

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[IEEE 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Sendai, Japan (2016.8.22-2016.8.25)] 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Imaging of nanoscale particles in microfluidic devices using super-lens manipulated by optically-induced dielectrophoresis

Lai, Hok Sum Sam, Zhang, Guanglie, Li, Wen J.
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Year:
2016
Language:
english
DOI:
10.1109/nano.2016.7751531
File:
PDF, 414 KB
english, 2016
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