Depth distribution of Mn in Mn doped GaAs using secondary...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2016 / 05 Vol. 34; Iss. 3

Depth distribution of Mn in Mn doped GaAs using secondary ion mass spectrometry

Karki, Vijay, Bhattacharya, Debarati, Chandrasekhar Rao, Turumella V., Alamelu, Devanathan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
34
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4943948
Date:
May, 2016
File:
PDF, 1.48 MB
english, 2016
Conversion to is in progress
Conversion to is failed