Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections
Skoupy, Radim, Nebesarova, Jana, Krzyzanek, VladislavVolume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192761600547X
Date:
July, 2016
File:
PDF, 334 KB
english, 2016