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Electron Beam Induced Mass Loss Dependence on Stained Thin...

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Skoupy, Radim, Nebesarova, Jana, Krzyzanek, Vladislav
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192761600547X
Date:
July, 2016
File:
PDF, 334 KB
english, 2016
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