[IEEE IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Florence, Italy (2016.10.23-2016.10.26)] IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Self-adjustment methodology of a thermal camera for detecting faults in industrial machinery
Ramirez-Nunez, Juan A., Morales-Hernandez, Luis A., Osornio-Rios, Roque A., Antonino-Daviu, Jose A., Romero-Troncoso, Rene J.Year:
2016
Language:
english
DOI:
10.1109/IECON.2016.7793158
File:
PDF, 1.27 MB
english, 2016