Scalable Device Array for Statistical Characterization of...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2017 / 4 Vol. 25; Iss. 4

Scalable Device Array for Statistical Characterization of BTI-Related Parameters

Awano, Hiromitsu, Morita, Shumpei, Sato, Takashi
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Volume:
25
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2016.2638021
Date:
April, 2017
File:
PDF, 5.15 MB
english, 2017
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