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[IEEE 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2016.11.13-2016.11.16)] 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Study of repetitive avalanche stress invoked degradation of electrical properties of DMOS and TrenchMOS transistors
Marek, Juraj, Stuchlikova, Lubica, Jagelka, Martin, Chvala, Ales, Pribytny, Patrik, Donoval, Martin, Donoval, DanielYear:
2016
DOI:
10.1109/ASDAM.2016.7805912
File:
PDF, 478 KB
2016