![](/img/cover-not-exists.png)
[IEEE 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2016.11.13-2016.11.16)] 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Particle detectors based on 4H-SiC epitaxial layer and their properties
Zat'ko, B., Hrubcin, L., Sagatova, A., Bohacek, P., Dubecky, F., Sedlackova, K., Sekacova, M., Arbet, J., Necas, V., Skuratov, V. A.Year:
2016
Language:
english
DOI:
10.1109/ASDAM.2016.7805915
File:
PDF, 309 KB
english, 2016