[IEEE 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Toronto, ON, Canada (2016.10.16-2016.10.19)] 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Investigation of the role of void sizes for failure of high voltage bushing
AJ, Christina, Salam, M. A., Ang, S. P., Fushuan Wen,, Rahman, Q. M., Hasan, Syeed, Voon, WilliamYear:
2016
Language:
english
DOI:
10.1109/CEIDP.2016.7785696
File:
PDF, 681 KB
english, 2016