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[IEEE 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol, Altai Republic, Russia (2016.6.30-2016.7.4)] 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Electrostatic discharge protection in 250 nm BCD technology for multi-functional control integrated circuits for power converters
Karpovich, Maksim S., Lys, Vasily D., Blum, Kirill E., Vasilyev, Vladislav Yu.Year:
2016
Language:
english
DOI:
10.1109/edm.2016.7538776
File:
PDF, 1.07 MB
english, 2016