A fast correlated multiple sampling technique based on...

Microelectronics Journal 2017 / 01 Vol. 59

A fast correlated multiple sampling technique based on 12-bit SAR ADC with digital calibration for low-noise CMOS image sensor

Nie, Kaiming, Yin, Zhaoyang, Xu, Jiangtao
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Volume:
59
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2016.11.010
Date:
January, 2017
File:
PDF, 1019 KB
english, 2017
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