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Theoretical modeling of electrical resistivity and Seebeck coefficient of bismuth nanowires by considering carrier mean free path limitation
Murata, Masayuki, Yamamoto, Atsushi, Hasegawa, Yasuhiro, Komine, Takashi, Endo, AkiraVolume:
121
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4973191
Date:
January, 2017
File:
PDF, 2.26 MB
english, 2017