Theoretical modeling of electrical resistivity and Seebeck...

Theoretical modeling of electrical resistivity and Seebeck coefficient of bismuth nanowires by considering carrier mean free path limitation

Murata, Masayuki, Yamamoto, Atsushi, Hasegawa, Yasuhiro, Komine, Takashi, Endo, Akira
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Volume:
121
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4973191
Date:
January, 2017
File:
PDF, 2.26 MB
english, 2017
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