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[IEEE 2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) - Seoul, South Korea (2016.10.26-2016.10.28)] 2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) - Measuring error-tolerance in SRAM architecture on hardware accelerated neural network
Kwon, Sangheon, Lee, Kyungmin, Kim, Yoonsoo, Kim, Kyungah, Lee, Changmin, Ro, Won WooYear:
2016
Language:
english
DOI:
10.1109/ICCE-Asia.2016.7804818
File:
PDF, 234 KB
english, 2016